Talk Announcement-9/18 Friday 10am, Prof. Shawn Blanton from CMU
Date/Time：2015/09/18(Fri) AM10:00-12:00
Venue： Engineering Bldg. 4, ED 528
Speaker： Prof. Shawn Blanton
Dept. of Electrical and Computer Engineering, Carnegie Mellon University
Topic: Improving Design, Manufacturing, and Even Test through Test-Data Mining
Abstract: Since yield is not 100%, the main objective of manufacturing test has and continues to be screening out “bad” ICs. Today, however, test is being used to provide valuable information about failing chips, answering questions about whether the design, the fabrication process or some combination of the two is responsible for failure. The information extracted is, ideally, used to improve design, fabrication and even test itself. In this talk, an overview of research in the Carnegie Mellon Advanced Chip Testing Laboratory (http://www.ece.cmu.edu/~actl) in this area will be described. Experiment results from manufactured chips from both integrated device manufacturers (e.g., IBM) and chip-design houses (e.g., Nvidia) will be used to illustrate the utility of the described approaches.
Speaker's brief bio: Shawn Blanton is a professor in the Department of Electrical and Computer Engineering at Carnegie Mellon University where he formerly served as director of the Center for Silicon System Implementation, an organization that consisted of 18 faculty members and over 80 students that focused on the design and manufacture of silicon-based systems. He currently serves as the Associate Director of the SYSU-CMU Joint Institute of Engineering (JIE, http://jie.cmu.edu/). He received the Bachelor's degree in engineering from Calvin College in 1987, a Master's degree in Electrical Engineering in 1989 from the University of Arizona, and a Ph.D. degree in Computer Science and Engineering from the University of Michigan, Ann Arbor in 1995.
Professor Blanton’s research interests are housed in the Advanced Chip Testing Laboratory (ACTL, www.ece.cmu.edu/~actl) and include the design, verification, test and diagnosis of integrated, heterogeneous systems. He has published many papers in these areas and has several issued and pending patents in the area of IC test and diagnosis. Prof. Blanton has received the National Science Foundation Career Award for the development of a microelectromechanical systems (MEMS) testing methodology and two IBM Faculty Partnership Awards. He is a Fellow of the IEEE, and is the recipient of the 2006 Emerald Award for outstanding leadership in recruiting and mentoring minorities for advanced degrees in science and technology.
Your attendance is most welcome!
Aileen Yu 游雅玲
EECS International Graduate Program
National Chiao Tung University
http://eecsigp.nctu.edu.tw/
Tel:+886-3-5131290, +886-3-5712121 ext:54019
Email:[email protected]
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